[Current] Development of low-latency/high-reliability sensing and management technology for NAND flash memory reflecting variation between chips

Project: 2020.09.16 – 2025.9.15

Research Objectives

1. NAND flash memory research environment establishment and plan establishment reflecting variation between chips
2. Development of adaptive sensing technology based on transfer learning
3. Development of management technology based on transfer learning
4. Developing universal learning models and optimizing the complexity of the learning process
5. Model lightweighting and optimization methodology through meta-learning

• Keyword: NAND flash memory, Chip variation, Transfer learning, Meta learning
• Members: Jeongju Jee, Seonmin Lee
• Research funded by Samsung Electronics